Surface and Thin Film Analysis. A Compendium of Principles, Instrumentation, and Applications

Surface and Thin Film Analysis. A Compendium of Principles, Instrumentation, and Applications
артикул: 33823662
20,850.00 руб.-1%
20,638.86 руб.
Доставка из: Россия
   Описание
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts – electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) «… a useful resource…» (Journal of the American Chemical Society)
   Характеристики
age: 0
author: Friedbacher Gernot
genres_list: 5217,6351
ISBN: 9783527636945
lang: en
litres_isbn: 978-5-04-475669-4
publisher: John Wiley & Sons Limited
Type: book
Форматы: PDF
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