DY294 Digital Transistor Tester Semiconductor Tester DC Parameter Tester

Description DY294 is mainly used for testing the DC parameters of manifold semiconductors such as diode transistor controlled silicon and field effect transistor DY294 also can be used to test the withstand voltage of capacitor protection voltage of varistor and isolation of electrical Meanwhile DuoYI DY294 can test 78 and 79 series three terminal voltage regulator Measuring forward voltage reverse voltage forward saturation voltage drop amplification factor reverse leakage current of various crystal diode audion silicon controlled rectifier SCR field effect transistor FET Measuring rated working voltage of chemical capacitor terylene capacitor DY294 Ta capacitor Leaded multilayer ceramic capacitor high voltage lacker Measuring protection voltage of varistor Features Measure the DC parameters of manifold semiconductors such as diode transistor controlled silicon and field effect transistor Measure capacitor varistor DC voltage signal source Measure 78 and 79 three terminal voltage regulator Data hold low battery warning Specifications FunctionRangeDisplay ScopeResolutionOperation ConditionV BR 1000V0 1999V1Vbreakdown current1mA200V0 199 9V0 1Vbreakdown current1mAVCC Set 2A Ic 0 6 00V0 01VIc2000mA Ib200mA800mA Ic 0 6 00V0 01VIc800mA Ib80mA100mA Ic 0 6 00V0 01VIc100mA Ib1mA10mA Ic 0 6 00V0 01VIc10mA Ib1mAhFE10mA Ib 0 199 90 1Ib10mA1mA Ib 0 19991Ib1mA1A Ib 0 19991Ib0 01mAICEO2000A0 1999A1AVce 27V78 79 three pole constant voltage value78xx 79xx0 2