DY294 Digital Transistor Tester Semiconductor Tester DC Parameter Tester

DY294 Digital Transistor Tester Semiconductor Tester DC Parameter Tester
Eachine1
артикул: 1170138
СОГЛАСНО НАШИМ ДАННЫМ, ЭТОТ ПРОДУКТ СЕЙЧАС НЕ ДОСТУПЕН
$56.59
Доставка из: Китай
   Описание
Description: DY294 is mainly used for testing the DC parameters of manifold semiconductors such as diode, transistor, controlled silicon and field effect transistor. DY294 also can be used to test the withstand voltage of capacitor, protection voltage of varistor and isolation of electrical. Meanwhile DuoYI DY294 can test 78 and 79 series three-terminal voltage regulator. Measuring forward voltage, reverse voltage, forward saturation voltage drop, amplification factor, reverse leakage current of various crystal diode, audion, silicon controlled rectifier(SCR) field effect transistor(FET). Measuring rated working voltage of chemical capacitor, terylene capacitor, DY294 Ta capacitor, Leaded multilayer ceramic capacitor, high voltage lacker. Measuring protection voltage of varistor. Features: Measure the DC parameters of manifold semiconductors such as diode, transistor, controlled silicon and field effect transistor. Measure capacitor, varistor, DC voltage signal source. Measure 78 and 79 three terminal voltage regulator. Data hold, low battery warning. Specifications: Function Range Display Scope Resolution Operation Condition V(BR) 1000V 0-1999V 1V breakdown current < 1mA 200V 0-199.9V 0.1V breakdown current < 1mA VCC(Set) 2A(Ic) 0-6.00V 0.01V Ic2000mA Ib200mA 800mA(Ic) 0-6.00V 0.01V Ic800mA Ib80mA 100mA(Ic) 0-6.00V 0.01V Ic100mA Ib1mA 10mA(Ic) 0-6.00V 0.01V Ic10mA Ib1mA hFE 10mA(Ib) 0-199.9 0.1 Ib10mA 1mA(Ib) 0-1999 1 Ib1mA 1A(Ib) 0-1999 1 Ib0.01mA ICEO 2000A 0-1999A 1A Vce27V 78,79 three-pole constant voltage value 78xx/79xx 0-24.0V 0.1V Ui27V Package Included: 1 x DY294 Transistor meter 1 x User manual 1 x Black bag Detail Pictures:
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