Metal Microscope Carbon Steel Analysis Semiconductor Test Chip Detection Zoom in 50-600 Times Failure Analysis Carbon Structure

Metal Microscope Carbon Steel Analysis Semiconductor Test Chip Detection Zoom in 50-600 Times Failure Analysis Carbon Structure
sku: 32910014524
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$2,685.00
Shipping from: China
   Technical Details
Brand Name: FGHGF
Carbon steel analysis: LCD detection
Carbon structure: D
Chip detection: A
Drawtube: Monocular
Failure analysis: C
Features: High Definition,PORTABLE,Handheld
Magnification Ratio: 500X - 1500X
Material: Metal
metallurgy: E
Metal microscope: mineral
Model Number: 50-600X times
Semiconductor test: Microelectronics
Theory: Metallurgical Microscope
Zoom in 50-600 times: B
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